TY  - BOOK
AU  - Akchulakov,M.
AU  - Akhtar,S.
AU  - Arora,R.
AU  - Balyakix,S.
AU  - Battistig,G.
AU  - Baunack,S
AU  - Bayadilov,E
AU  - Bayrachxyi,B
AU  - Bazuev,G.
AU  - Berger,R
AU  - Bidkk,O
AU  - Chanh,N
AU  - Charikova,T.
AU  - Chebukov,S.
AU  - Cheng,B.
AU  - Choudhary,B
AU  - Choudhary,R.
AU  - Courseille,C.
AU  - Couzi,M.
AU  - Dhksi,M.
AU  - Donovan,P
AU  - Dozsa,L.
AU  - Dubourg,R
AU  - Dumercq,B
AU  - Ebert,J.
AU  - Engelko,V.
AU  - Erofeev,V.
AU  - Fedosov,S.
AU  - Fedosyuk,V.
AU  - Fermi,F
AU  - Gojiozov,V
AU  - Gorxert,P.
AU  - Gould,R
AU  - Gyulai,J.
AU  - Görlich
AU  - Haktmann,U.
AU  - Heilmann,R
AU  - Hijjaka,M.
AU  - Hiti,M.
AU  - Horak,J
AU  - Ismail,B
AU  - Jacobs,B
AU  - Jakubowski,W.
AU  - Kasyutich,O.
AU  - Kazdaev,Kh
AU  - Ke,T.
AU  - Kim,H
AU  - Klkint,C.
AU  - Krylov,K.
AU  - Kumar,A.
AU  - Lazarenko,A.
AU  - Liashok,L.
AU  - Lippold,B.
AU  - Lostak,P
AU  - Lysenko,V.
AU  - Malyush,M.
AU  - Mebarki,M.
AU  - Medvedkin,G.
AU  - Mehta,S.
AU  - Miane,J
AU  - Mlik,Y.
AU  - Mogilyanskii,D.
AU  - Mohammed,M.
AU  - Morgan,D.
AU  - Nagornyi,A
AU  - Nazarov,A.
AU  - Neumann,H
AU  - Northwood,D.
AU  - Nowinski,J.
AU  - Oelgakt,G.
AU  - Ozvoldova,M.
AU  - Pancir,J
AU  - Paracchini,C.
AU  - Ponomarev,A.
AU  - Prasad,G.
AU  - Pöppl,A.
AU  - Quintero,M.
AU  - Rao,K
AU  - Ristau,D
AU  - Rost,A.
AU  - Rud,Yu
AU  - Sato,K
AU  - Schvoerer,M.
AU  - Seidel,P
AU  - Serfozo,G.
AU  - Sharma,B.
AU  - Sharma,R
AU  - Sheinin,S.
AU  - Shekhtman,V.
AU  - Sheleg,M.
AU  - Sijisa,Z
AU  - Singh,V
AU  - Smith,I.
AU  - Stary,Z.
AU  - Stephenson,J
AU  - Stobbs,W
AU  - Stöpel,U.
AU  - Sveo,P
AU  - Tairov,M.
AU  - Tovar,R
AU  - Tsidilkovskii,I.
AU  - Tsidilkovskit,V.
AU  - Turtenwald,M.
AU  - Völkel,G.
AU  - Wanklyn,B.
AU  - Welling,H.
AU  - Wesolowski,P
AU  - Woolley,J.
AU  - Zakitskii,I
AU  - Zangar,H
AU  - Zhou,Z.
AU  - Zkhe,A.
TI  - Physica status solidi / A. 
T2  - Physica status solidi / A.
SN  - 9783112472835
PY  - 2021///]
CY  - Berlin, Boston : 
PB  - De Gruyter, 
KW  - NON-CLASSIFIABLE
KW  - bisacsh
N1  - Frontmatter --; Contents --; Review Article --; Photoelectric Anisotropy of 1I-I V- V2 Ternary Semiconductors --; Original Papers and Short Notes --; The Many Beam Dynamical Theory of Contrast in Electron Microscope Images of Microtwins for the Non-Symmetrical Laue and Non-Column Cases --; Optimisation of the Fourier Components of Potential in Bloch Wave TEM Image Contrast Calculations --; RF Plasma Modification of Heavily Destroyed Ion Implanted Subsurface Silicon Layers --; Electrical Properties of Superionic Silver-Borate Glasses Doped with Agl --; Substitutional Defects in Sb»Te3 Crystals --; Simulated Quenching of Silicon WSR Monochromators Using WSR Section Topography --; Structural Phase Transition in the Perovskite-Type Layer Compound (C3H,NH3),PbCI4 --; Mechanical Model of the Bamboo Boundary Internal Friction Peak --; Steady-State Creep and Strain Transients for Stress Change Tests in an AI-0.5 wt% Zn Solid Solution Alloy --; Stoichiometric Annealing and Electrical Properties of Hg0 8Cd0 ;Te Grown by Solid State Recrystallization --; Application of Thermal Conductivity' Measurement by the Relaxation Method to Crystallization Kinetics of Glassy As2Se3 1 mol°0 In --; Structural Phase Transitions of Layer Compounds KFeF4, KTiF4. and KYF4 --; (Culn)J.(Agln)!/Mn2jTe:, Alloys: T(z) Phase Diagram and Optical Energy Gap Values --; X-Ray Diffraction and Conductivity Investigations of Lanthanum-Doped Barium Titanate Ceramics --; Determination of the Band Discontinuities of GaSb(n)-Ga0 MAl0.17Sb(p) Heterojunetion by Capacitanc^Voltage Measurements --; Influence of Annealing Regimes on Phase Transitions in X'itrogen and Carbon Ion Implanted Molybdenum --; Dependence of the Temperature Coefficient of the Strain Coefficients of Resistance of Double-Layer Thin Metallic Films on Thermal Strains --; Characterization of Dielectric Films and Damage Threshold at 1.064 ¡xm --; Investigation of the Structure and Properties of KCl-NaCl Crystals at Elevated Temperatures --; Changes in Structure and Properties of Xb.,05 Anodic Films Caused by Generating Anion Defects on Their Surface --; Reliability of Tantalum Oxide Film Capacitors --; A Study of UY/Ozone Cleaning Procedure for Silicon Surfaces --; Preparation and Faraday Rotation Spectra of YIG:Pb, Pt Garnet Films --; Structural and Electronic Properties of Evaporated Thin Films of Cadmium Telluride --; ESR Investigation of the Oxygen Vacancy in Pure and Bi203-Doped ZnO Ceramics --; Determination of the Germanium Acceptor Ionisation Energy of ALGai-.As (0 ^ x ^ 0.40) by Hall Effect and Luminescence --; Peculiarities of Galvanomagnetic and Thermoelectric Properties of YBa2_xLa:cCu307_a Solid Solutions --; Multi-Gap Model for Tunneling in High-T,, Superconductors --; Columnar Structure and Texture [001] in Co-Ni-W Films --; Bit Analysis of Magnetic Recording Media by Force Microscopy --; Deep Trapping of Injected Carriers in Ferroelectric Polymer --; Dielectric Properties of TbAs04 Single Crystals --; Dielectric Relaxation in Glassy Se and Seioo—^Te^ Alloys2) --; Optical Properties of Uranium in Potassium Alumino-Phosphate Glasses --; Defect Annealing in Pure CdF2 Crystals --; Mécanismes de thermoluminescence dans des fluorines CaF2 naturelles et de synthèse --; Short Notes; restricted access
UR  - https://doi.org/10.1515/9783112472842
UR  - https://www.degruyter.com/isbn/9783112472842
UR  - https://www.degruyter.com/document/cover/isbn/9783112472842/original
ER  -