TY - BOOK AU - Akchulakov,M. AU - Akhtar,S. AU - Arora,R AU - Balyakin,S AU - Battistig,G AU - Baunack,S AU - Bayadilov,E AU - Baybachnyi,B. AU - Bazuev,G. AU - Berger,R AU - Budke,O. AU - Chanh,N AU - Charikova,T. AU - Chebukov,E. AU - Cheng,B. AU - Choudhaby,R. AU - Choudhary,B. AU - Courseille,C. AU - Couzi,M. AU - Dhesi,M. AU - Donovan,P AU - Dozsa,L. AU - Dubourg,R. AU - Dumercq,B AU - Ebert,J AU - Ekofeev,V. AU - Engelko,V. AU - Fedosov,S AU - Fedosyuk,V. AU - Fermi,F. AU - Gomozov,V. AU - Gould,R. AU - Gyulai,J AU - Görlich AU - Görnert,P AU - Habtmann,U AU - Heilmann,R AU - Hidaka,M. AU - Hiti,M. AU - Horak,J AU - Ismail,B. AU - Jacobs,B AU - Jakubowski,W AU - Kasyutich,O. AU - Kazdaev,Kh AU - Ke,T. AU - Kim,H AU - Kleint,C. AU - Krylov,K AU - Kumar,A. AU - Lazarenko,A. AU - Liashok,L. AU - Lippold,B AU - Lostak,P AU - Lysenko,V. AU - Malyush,M. AU - Mebarki,M. AU - Medvedkin,G. AU - Mehta,S. AU - Miane,J AU - Mlik,Y AU - Mogilyanskii,D AU - Mohammed,M. AU - Morgan,D AU - Nagornyi,A. AU - Nazarov,A AU - Neumann,H AU - Northwood,D AU - Nowinski,J AU - Oelgart,G. AU - Ozvoldova,M. AU - Pabacchini,C AU - Pancis,J AU - Ponomarev,A. AU - Prasad,G. AU - Pöppl,A. AU - Quintero,M. AU - Rao,K. AU - Ristau,D AU - Rost,A AU - Rtjd,Yu AU - Sato,K AU - Schvoerer,M AU - Seidel,P AU - Serfozo,G. AU - Sharma,B. AU - Sharma,R. AU - Sheinin,S. AU - Shekhtman,V AU - Sheleg,M. AU - Simsa,Z. AU - Singh,V. AU - Skatkov,L. AU - Smith,I AU - Stary,Z. AU - Stephenson,J AU - Stobbs,W AU - Stopel,U AU - Svec,P AU - Tairov,M. AU - Tovar,R AU - Tsidilkovskii,I AU - Tsidilkovskii,V. AU - Turtenwald,M AU - Völkel,G. AU - Wanklyn,B AU - Welling,H AU - Wesolowski,P AU - Woolley,J AU - Zangar,H AU - Zaritskii,I AU - Zehe,A. AU - Zhou,Z TI - Physica status solidi / A. T2 - Physica status solidi / A. SN - 9783112479636 PY - 2021///] CY - Berlin, Boston : PB - De Gruyter, KW - SCIENCE / General KW - bisacsh N1 - Frontmatter --; Author Index --; Contents --; Reyiew Article --; Photoelectric Anisotropy of II IV-V2 Ternary Semiconductors --; Original Papers --; The Many Beam Dynamical Theory of Contrast in Electron Microscope Images of Microtwins for the Non-Symmetrical Laue and Non-Column Cases --; Optimisation of the Fourier Components of Potential in Bloch Wave TEM Image Contrast Calculations --; RF Plasma Modification of Heavily Destroyed Ion Implanted Subsurface Silicon Layers --; Electrical Properties of Superionic Silver-Bora te Glasses Doped with Agl --; Substitutional Defects in Sb2Te3 Crystals --; Simulated Quenching of Silicon WSR Monochromators Using WSR Section Topography --; Structural Phase Transition in the Perovskite-Type Layer Compound (C3H7NH3),PbCl4 --; Mechanical Model of the Bamboo Boundary Internal Friction Peak --; Steady-State Creep and Strain Transients for Stress Change Tests in an Al-0.5 w t% Zn Solid Solution Alloy --; Stoichiometric Annealing and Electrical Properties of Hgo.3Cdo.2Te Grown by Solid State Recrystallization --; Application of Thermal Conductivity Measurement by the Relaxation Method to Crystallization Kinetics of Glassy As2Se3 + 1 mol% In --; Structural Phase Transitions of Layer Compounds KFeF4, KTiF4, and KVF4 --; (CuIn)x(AgIn)!(Mn2ZTe2 Alloys: T(z) Phase Diagram and Optical Energy Gap Values --; X-Ray Diffraction and Conductivity Investigations of Lanthanum-Doped Barium Titanate Ceramics --; Determination of the Band Discontinuities of GaSb(n)-Ga0 83Al0.17Sb(p) Heterojunction by Capacitance-Voltage Measurements --; Influence of Annealing Regimes on Phase Transitions in Nitrogen and Carbon Ion Implanted Molybdenum --; Dependence of the Temperature Coefficient of the Strain Coefficients of Resistance of Double-Layer Thin Metallic Films on Thermal Strains --; Characterization of Dielectric Films and Damage Threshold at 1.064 ¡xm --; Investigation of the Structure and Properties of KCl-NaCl Crystals at Elevated Temperatures --; Changes in Structure and Properties of NltaOs Anodic Films Caused by Generating Anion Defects on Their Surface --; Reliability of Tantalum Oxide Film Capacitors --; A Study of UV/Ozone Cleaning Procedure for Silicon Surfaces --; Preparation and Faraday Rotation Spectra of YIG:Pb, Pt Garnet Films --; Structural and Electronic Properties of Evaporated Thin Films of Cadmium Telluride --; ESR Investigation of the Oxygen Vacancy in Pure and Bi203-Doped ZnO Ceramics --; Determination of the Germanium Acceptor Ionisation Energy of ALGai-^As (0 ^ * ^ 0.40) by Hall Effect and Luminescence --; Peculiarities of Galvanomagnetic and Thermoelectric Properties of YBaa-JLaxCuaO?-,» Solid Solutions --; Multi-Gap Model for Tunneling in High-Tc Superconductors --; Columnar Structure and Texture [001] in Co-Ni-W Films --; Bit Analysis of Magnetic Recording Media by Force Microscopy --; Deep Trapping of Injected Carriers in Ferroelectric Polymer --; Dielectric Properties of TbAs04 Single Crystals --; Dielectric Relaxation in Glassy Se and Sei«0_«Te* Alloys2) --; Optical Properties of Uranium in Potassium Alumino-Phosphate Glasses --; Defect Annealing in Pure Cdr2 Crystals --; Mécanismes de thermoluminescence dans des fluorines CaF2 naturelles et de synthèse --; Short Notes; restricted access; Issued also in print UR - https://doi.org/10.1515/9783112479643 UR - https://www.degruyter.com/isbn/9783112479643 UR - https://www.degruyter.com/document/cover/isbn/9783112479643/original ER -