TY  - BOOK
AU  - Abbé,J.Ch
AU  - Ahmed,A.B.
AU  - An,Hu
AU  - Anachkova,E.
AU  - Andreev,A.V.
AU  - Arefiev,K.P.
AU  - Aronov,D.A.
AU  - Ashok,S.
AU  - Badr,Y.
AU  - Bahadur,D.
AU  - Bartashevich,M.I.
AU  - Batana,A.
AU  - Beauchamp,P.
AU  - Benhaddane,K.
AU  - Bodade,S.V.
AU  - Borombaev,M.K.
AU  - Bouazra,Y.
AU  - Burger,J.P.
AU  - Castaing,J.
AU  - Cendlewska,B.
AU  - Chen,J.Y.
AU  - Chirtoc,M.
AU  - Christoph,V.
AU  - Chumakov,A.I.
AU  - Czapla,Z.
AU  - Cândea,M.
AU  - Danesh,P.
AU  - Daou,J.N.
AU  - Davydov,V.N.
AU  - Deryagin,A.V.
AU  - Deshmukh,B.T.
AU  - Dominguez-Rodriguez,A.
AU  - Dosmagambetov,E.S.
AU  - Duan,Feng
AU  - Duplâtre,G.
AU  - Dădârlat,D.
AU  - Ecke,W.
AU  - Efimov,V.M.
AU  - El-Kabbany,F.
AU  - El-Nahas,M.M.
AU  - Elk,K.
AU  - Esaev,D.G.
AU  - Farid,A.M.
AU  - Foct,J.
AU  - Fritzer,H.P.
AU  - Fritzsch,L.
AU  - Gartia,R.K.
AU  - Gatterer,K.
AU  - Georgiev,St
AU  - Georgy,K.H.
AU  - Giewont,K.
AU  - Gon,H.B.
AU  - Gruber,H.
AU  - Gröger,V.
AU  - Gupta,S.K.
AU  - Gyuro,I.
AU  - Görlich
AU  - Havela,L.
AU  - Hegedus,P.
AU  - Hergt,R.
AU  - Horie,S.
AU  - Hutton,D.R.
AU  - Ishida,K.
AU  - Jakubas,R.
AU  - Jenssen,H.P.
AU  - Jung,T.
AU  - Kaczmarek,W.A.
AU  - Kaminskii,A.A.
AU  - Kato,M.
AU  - Kawano,H.
AU  - Kertész,L.
AU  - Kessler,A.
AU  - Khodos,I.I.
AU  - Khundzhua,A.G.
AU  - Klein,U.
AU  - Korshunov,F.P.
AU  - Krautz,E.
AU  - Kruglov,M.V.
AU  - Kurbanov,K.
AU  - Kê,T.S.
AU  - Lee,Tong Chang
AU  - Levitin,R.Z.
AU  - Logvinskii,L.M.
AU  - Lopatin,V.V.
AU  - Lucasson,A.
AU  - Mady,KhA.
AU  - Maequez,R.
AU  - Mamatkulov,B.R
AU  - Manzel,M.
AU  - Marchenko,I.G.
AU  - Marcinkowski,M.J.
AU  - Markosyan,A.S.
AU  - Meerson,E.E.
AU  - Mendelson,S.
AU  - Michalke,W.
AU  - Moharil,S.V.
AU  - Nagata,S.
AU  - Nakamura,Y.
AU  - Narewski,E.
AU  - Nikolaichik,V.I.
AU  - Northwood,D.O.
AU  - Ohshima,N.
AU  - Perov,G.N.
AU  - Petrosyan,A.G.
AU  - Petrov,A.S.
AU  - Pfeiffer,H.
AU  - Pietrzak,J.
AU  - Popitsch,A.
AU  - Prakash,J.
AU  - Rao,K.V.
AU  - Renyuan,Qian
AU  - Rimeika,R.
AU  - Rochegude,P.
AU  - Said,G.
AU  - Salm,J.
AU  - Sanchez,M.
AU  - Savatinova,I.
AU  - Schmidt,U.
AU  - Schultze,D.
AU  - Schülbe,R.
AU  - Sechovsky,V.
AU  - Serna,J.
AU  - Shengqing,Lü
AU  - Shi,J.
AU  - Shirafuji,J.
AU  - Shirakawa,K.
AU  - Siebert,P.
AU  - Smetana,Z.
AU  - Smirnov,G.V.
AU  - Smith,I.O.
AU  - Sobczyk,L.
AU  - Soliman,H.S.
AU  - Solomin,I .K.
AU  - Somogyi,K.
AU  - Soriano,M.R.
AU  - Sumiyama,K.
AU  - Surov,YuP.
AU  - Svoboda,P.
AU  - Szymaszek,J.
AU  - Szász,A.
AU  - Taha,S.
AU  - Tawfik,N.L.
AU  - Titel,W.
AU  - Tomov,I.
AU  - Troshchinskii,V.T.
AU  - Troup,G.J.
AU  - Uecker,R.
AU  - Ufert,K.-D.
AU  - Vajda,P.
AU  - Vyas,H.P.
AU  - Wang,D.M.
AU  - Wnuk,J.J.
AU  - Xiang-Jin,Li
AU  - Yao,Y.D.
AU  - Yen,T.Y.
AU  - Yizhen,He
AU  - Youming,Chang
AU  - Youssef,T.H.
AU  - Yuan-Hang,Wang
AU  - Zakharova,M.I.
AU  - Zhang,L.D.
AU  - Zheng,Yu
AU  - Zongquan,Li
AU  - Ćiplys,D.
AU  - Šima,V.
TI  - Physica status solidi / A. 
T2  - Physica status solidi / A.
SN  - 9783112480830
PY  - 2021///]
CY  - Berlin, Boston : 
PB  - De Gruyter, 
KW  - SCIENCE / General
KW  - bisacsh
N1  - Frontmatter --; Author Index --; Contents --; Original Papers and Short Notes --; Structure --; Experimental Determination of Electron Escape Weight Functions by Using the Methods oi "Calibrated Amorphous Layers" and "Total External Reflection" --; Reanalysis of the Burgers Circuit --; Polymorphism and Electronic Properties of 3-Ethyl-5-[2- (3-Ethyl-2-Benzothiazolinylidene)- Ethylidene] -Rhodanine --; Orientation Dependence of the Effective Depth of X-Ray Penetration --; Interstitial Atom Ordering in Binary Fe-N Solid Solutions Studied by Mössbauer Spectrometry --; On the Influence of Ar+ Ion Bombardment on the SiLVV Auger Line in Silicon Nitride Films --; Formation of Texture in Co/Cr Films for Perpendicular Magnetic Recording --; On the Stability of Metastable Precipitates in an Al-1.87 at% Cu Alloy at Elevated Temperature --; Crystallization of Metallic Glass Pd80Si20 --; Study of Crystal and Electronic Structure of Ti-Cr Alloys during Decomposition of ß-Solid Solution --; Lattice properties --; Ferroelectricity Associated with the Metastable Phase III of AgNO3 --; Raman Scattering in Glow Discharge Si:H:Cl Films --; Mechanisms for Martensitic Transformations in A15 Superconductors --; Defects, atomistic aspects --; Effect of High AC Field and X-Ray Irradiation on the Dielectric Properties of Quenched LiF Single Crystals --; High Temperature Internal Friction Peak in High Purity Single Crystal Aluminium Sheets and Electron Microscopic Observation on the Related Dislocation Configurations --; Internal and Effective Stresses in the Steady-State Creep of Polycrystalline Cadmium at 0.5 Tm --; Positron Annihilation in Polyethylene Samples Studied by the Doppler Broadening of the Annihilation Radiation Lineshape Technique --; Different Etch Pit Shapes Revealed by Molten KOH Etching on the (001) GaAs Surface and Their Dependence on the Burgers Vectors --; Defect Study of ß-TbH(D)1.9+x --; Core Structure of the a<100> <001> Edge Dislocation in a B2 Ordered Alloy --; Creep of CoO Single Crystals --; Evaluation of Critical Resolved Shear Stress for Systems with General Periodic Stress Fields --; The Low-Temperature Interdiffusion in Compositionally Modulated Nb-Ti Films --; Magnetism --; Magnetic and Crystallographic Properties of Gd(Cu1+x Cox)2 --; Magnetic Properties of Metastable α-Mn-Type Mn1-y Fey Alloys Produced by Vapor Quenching --; Localized electronic states and transitions --; Thermoluminescence of K2Cd2(S04)3 --; Role of the Background Current in Analysing the ITC Spectrum --; Electric Field Effect on Characteristics of Indium Antimonide MOS Structures --; Electric transport --; The Field and Spectrum Dependences of Impurity Photoconductivity with Exclusion in Compensated Semiconductors --; A Simple Detection Method in Photothermal Deflection Measurements on Thin-Film Semiconductors --; Electrical Resistivity and Magnetization Studies of Some Commercial Steels --; Scattering Anisotropy of Conduction Electrons in CuBe Alloys --; Changes of Electrical Conductivity, Magnetic Susceptibility, and IR Spectra in the Ternary System MOn-x WxO3n-1 --; Upper Critical Field Deduced from Critical Current Data --; γ-Irradiation Effect on Electronic Properties in Hydrogenated Amorphous Silicon --; Charge Transport through Layers of Thermally Nitrided SiO2 --; Short Notes --; A Method for Studying Parameter Variations in VPE Technology --; Sur certains effets multifaisceaux en faisceau convergent --; Contributions of Elastic Strain and Electric Field to Acousto-Optic Diffraction in LiNbO3: Ti --; Low Temperature Thermal Expansion of Cubic Ionic Crystals --; Determination of the Sign of a Dissociated Dislocation in Weak Beam --; Synthesis and Characterization of NASICON Based Glass --; Macrodefects of Pyrolytic Boron Nitride Structure --; Role of Grain Boundary Movements on the Creep Rate Sensitivities in Aluminium --; Peculiarities of Minority Carrier Lifetime Variations in p-n-p-n Structures Fabricated upon Neutron-Transmutation Doped Silicon and Irradiated by Fast Electrons --; Anomalous Temperature Dependence of Magnetocrystalline Anisotropy Constants of BaIn 1.5Fe10.5 O19 Single Crystals --; Influence of Hydrogen on the Magnetic Properties of the U-Co System --; On the Influence of the Single Particle Coercivities on the Virgin Curves of Poly crystalline Magnets --; Spectral Composition and Kinetics of 2 um Stimulated Emission of Ho3+Ions in Sensitized Y3Al5O12 and Lu3Al5O12 Single Crystals --; Thermally Stimulated Luminescence of NaAlSi3O8 and Its Analysis --; Investigations of Interface States in Si/Si-Oxynitride/Al Structures Using DLTS --; EPR of Laser Material SrAlF5:Cr3+ --; Crystal Growth and Spectroscopic Properties of Nd3+ Ions in a New Nonstoichiometric Bismuth Phosphate Bi5.8 PO11.2 --; Electrical Resistivity of Amorphous Antimony Trisulphide Films --; Dielectric Relaxation in ND4DSeO4 (d-AHSe) --; Spontaneous and Field Induced Current Peaks at the Order-Disorder Phase Transition of NH4Cl --; On the Ubiquity of Ion Bombardment Modification of Silicon Schottky Barriers --; Pre-Printed Titles; restricted access; Issued also in print
UR  - https://doi.org/10.1515/9783112480847
UR  - https://www.degruyter.com/isbn/9783112480847
UR  - https://www.degruyter.com/document/cover/isbn/9783112480847/original
ER  -