TY  - BOOK
AU  - Auleytner,J
AU  - Bak-Misiuk,J
AU  - Berger,H
AU  - Bhar,G .C.
AU  - Braun,U.
AU  - Buhrig,E
AU  - Butter,E
AU  - Demus,D
AU  - Diele,S
AU  - Feltz,A.
AU  - Fenster,J
AU  - Fichtner,K.
AU  - Finger,G.
AU  - Fischer,K
AU  - Furmanik,Z.
AU  - Geidel,B
AU  - Ghosh,D .K
AU  - Goliö,L
AU  - Gottschalch,V.
AU  - Görls,H.
AU  - Hein,K
AU  - Hejtminek,J
AU  - Heydenbeich,J
AU  - Hobler,H.-J.
AU  - Jurek,K
AU  - Jurkschat,K
AU  - Kamarad,J
AU  - Kbesse,H.
AU  - Klimakow,A.
AU  - Koknatowski,J
AU  - Kurth,E.
AU  - Kühn,G.
AU  - Leban,I
AU  - Mihailov,M.G.
AU  - Minchev,G.M
AU  - Morawiec,J
AU  - Mühlberg,M.
AU  - Neels,H.
AU  - Neumann,H.
AU  - Nowak,E
AU  - Omar,M.S.
AU  - Paufler,P
AU  - Pfaff,G.
AU  - Pollert,E
AU  - Pramatarova,L .D
AU  - Rabenstein,P
AU  - Reif,A.
AU  - Richter,R
AU  - Rosenthal,U
AU  - Samanta,L.K
AU  - Savova,E .B
AU  - Schenk,M.
AU  - Schmitz,W
AU  - Schmitz,W.
AU  - Schreiter,P
AU  - Schulz,B
AU  - Schulz,W
AU  - Schumann,B
AU  - Sieleb,J
AU  - Sinn,E
AU  - Stettin,H.
AU  - Tempel,A.
AU  - Triska,A
AU  - Umpfenbach,U
AU  - Wagner,G.
AU  - Walter,G
AU  - Weissflog,W
AU  - Werner,U.
AU  - Wienecke,M.
AU  - Zahn,A.
AU  - Zemanova,D.
TI  - Crystal Research and Technology: Journal of Experimental and Industrial Crystallography / Zeitschrift für experimentelle und technische Kristallographie. 
T2  - Crystal Research and Technology
SN  - 9783112485590
PY  - 2022///]
CY  - Berlin, Boston : 
PB  - De Gruyter, 
KW  - SCIENCE / Physics / Crystallography
KW  - bisacsh
N1  - Frontmatter --; Review --; Epitaxy of AIBIIICVI2 Semiconductors --; Original Papers --; Solid-State Reactivity and Mechanisms in Oxide Systems (IV) --; Crystal and Molecular Structure of (2-3-n-2-Butyne-l,4-diol)-bis-(triphenylphosphan)- nickel(O) Ni{[(C6H5)3P]2 (C4H6O2)} --; Crystal and Molecular Structure of N-(Diethylaminothiocarbonyl)-N'-phenyl-benzamidine --; Slip Band Formation during Bending of GaP Wafers --; OD Approach to the Polytypism in CdP2 --; Revealing of Lattice Defects on (111) Faces of Gallium Phosphide and Indium Phosphide by Chemical Etching --; Lattice Constants and Site Preference in the System Ni2SiO4-Co2SiO4 --; Nonstoichiometry and Point Defects in PbTe --; Simulation of the Carrier Diffusion Process for the Interpretation of EBIC Profiles --; Microhardness Scaling and Bulk Modulus-Microhardness Relationship in A"BIVCV2 Chalcopyrite Compounds --; Heat Capacity of Ag8Ge10P12 from 180 to 550 K --; Crystallographic Investigations of Glaucochroite in an Fe-Mn Slag --; X-ray Determination of Solid Solution Composition in the Melilite System Äkermanite (AK) — Gehlenite (Ge) - Soda Melilite (Sm) --; Chemical Etching and Polishing of InP --; Calculation of One-Dimensional Temperatures Profiles in a Crystal Growth Furnace with Special Respect to Germanium --; Liquid Crystalline Swallow-Tailed Compounds (II) --; Short Notes --; The Correlation between the Crystallization Field of Y3Fe5O12 and the Oxygen Ion Concentration of High-temperature Solvents --; Effect of the Pressing on the Properties of the Superconducting YBa2Cu3O7-x Phase --; Preparation of GaAs Substrates for MBE --; Optical Properties of Some Quaternary Copper Chalcopyrites --; On the Possibility of Application of X-ray Diffraction Edge Contrast for the Quantitative Determination of High-energy Heavy Ion Range in Silicon --; Growth of NaX Zeolites in the Presence of Triethanolamine (TEA) --; Contents; restricted access
UR  - https://doi.org/10.1515/9783112485606
UR  - https://www.degruyter.com/isbn/9783112485606
UR  - https://www.degruyter.com/document/cover/isbn/9783112485606/original
ER  -