TY  - BOOK
AU  - Adán,A.
AU  - Akimov,A.I.
AU  - Baran,M.
AU  - Bastie,P.
AU  - Batist,R.De
AU  - Bender,H.
AU  - Boiko,B.B.
AU  - Bolhuis,F.Van
AU  - Bosch,A.Van Den
AU  - Boulesteix,C.
AU  - Bourbet,A.
AU  - Broddin,D.
AU  - Bursill,L.A.
AU  - Cao,W.
AU  - Castano,V.M.
AU  - Chen,D.-X.
AU  - Coene,W.
AU  - Colaitis,D.
AU  - Cowley,J.M.
AU  - Czopnik,A.
AU  - Dalmai,G.
AU  - De Jong,A.F.
AU  - Delaey,L.
AU  - Delavignette,P.
AU  - Demyanov,S.E.
AU  - Diedering,A.
AU  - Dolino,G.
AU  - Dominec,J.
AU  - Dyck,D.Van
AU  - Dymont,Y.P.
AU  - Eftaxias,K.
AU  - Eyring,L.
AU  - Fan,XuDong
AU  - Fan,Yudian
AU  - Farmer,S.C.
AU  - Feng,Jiayou
AU  - Fiermans,L.
AU  - Flahaut,J.
AU  - Flevaris,N.K.
AU  - Frangis,N.
AU  - Gaboriaud,R.J.
AU  - Gaiduk,P.I.
AU  - Gashimov,G.I.
AU  - Gatalskaya,V.I.
AU  - Gatalskii,G.V.
AU  - Gomez,A.
AU  - Graef,M.De
AU  - Gratias,D.
AU  - Guitard,M.
AU  - Gutzow,I.
AU  - Guymont,M.
AU  - Görlich
AU  - Haange,R.J.
AU  - Hadjicontis,V.
AU  - Hallam,G.C.
AU  - Hashimoto,H.
AU  - Hayashi,Y.
AU  - He,Zhioang
AU  - Heuer,A.H.
AU  - Heydeneeich,J.
AU  - Hoogewijs,R.
AU  - Hummel,R.E.
AU  - Kalomiros,J.A.
AU  - Kang,Z.
AU  - Karakostas,Th
AU  - Koditsa,D.D.
AU  - Komarov,F.F.
AU  - Korshunov,F.P.
AU  - Krikor,H
AU  - Kumao,A.
AU  - Kuo,K.H.
AU  - Landuyt,J.Van
AU  - Ledzion,J.
AU  - Lefebvre,A.
AU  - Li,Hengde
AU  - Loiseau,A.
AU  - Loretto,M.H.
AU  - Lu,Ping
AU  - Madge,H.
AU  - Mahy,J.
AU  - Makovetskii,G.I.
AU  - Manolikas,C.
AU  - Martin,A.
AU  - Melzer,K.
AU  - Menon,J.
AU  - Mogeon,F.
AU  - Mustafaev,A.A.
AU  - Màder,M.
AU  - Nagels,P.
AU  - Nakagawa,M.
AU  - Namazov,A.D.
AU  - Nitzsche,W.
AU  - Nouet,G.
AU  - Ou,H.-J.
AU  - Pardo,M.P.
AU  - Pietsch,U.
AU  - Poelman,H.
AU  - Popovich,N.S.
AU  - Portier,R.
AU  - Prokhorenko,N.L.
AU  - Przysiupski,P.
AU  - Puzniak,R.
AU  - Rao,K.V.
AU  - Reiche,M.
AU  - Reichel,J.
AU  - Rhan,H.
AU  - Riviere,J.P.
AU  - Rouvière,J.L.
AU  - Ruedi,E.
AU  - Rustamov,A.G.
AU  - Ryzhkovskii,V.M.
AU  - Salem,M.Ben
AU  - Sarrazin,C.
AU  - Schapink,F.W.
AU  - Shaffer,S.J.
AU  - Smith,David J.
AU  - Smrcka,L.
AU  - Smrckovä,O.
AU  - Solovev,V.S.
AU  - Spendeler,J.
AU  - Spyridelis,J.
AU  - Stalinski,B.
AU  - Stalios,A.D.
AU  - Stormenos,J.
AU  - Stribuk,E.K.
AU  - Suryanarayana,C.
AU  - Sykorovä,D.
AU  - Szymczak,H.
AU  - Tendeloo,G .Van
AU  - Tendeloo,G.Van
AU  - Thoai,D.B.Tram
AU  - Thomas,G.
AU  - Tichy,L.
AU  - Tomas,A.
AU  - Torres-Villasenor,G.
AU  - Valdre,G.
AU  - Valdre,U.
AU  - Vanderschaeve,G.
AU  - Vanhellemont,J.
AU  - Vannuffel,C.
AU  - Vansummeren,J.
AU  - Varotsos,C.
AU  - Vasek,P.
AU  - Veis,A.N.
AU  - Vennik,J.
AU  - Volder,P.De
AU  - Wafik,A.H.
AU  - Wenk,H.R.
AU  - Werner,P.
AU  - Wiegers,G.A.
AU  - Yangui,B.
AU  - Yasuda,K.
AU  - Ye,H.Q.
AU  - Zandbergen,H.W.
AU  - Zehe,A.
AU  - Zeitler,E.
AU  - Zlateva,E.
TI  - Physica status solidi / A. 
T2  - Physica status solidi / A.
SN  - 9783112492994
PY  - 2022///]
CY  - Berlin, Boston : 
PB  - De Gruyter, 
KW  - SCIENCE / General
KW  - bisacsh
N1  - Frontmatter --; International Classification System for Physics --; Laudatio --; Contents --; Original Papers --; Bod-Like Defects in Silicon: Coesite or Hexagonal Silicon --; Thickness of Interfaces between Twins, Glide Domains, and Grain Boundaries in Oxides from HREM Studies (Sm2O3, Nd2O3, Pr7O12, Tb12O22, and YBa2Cu3O7-x) --; Direct Observation of Atomic Columns in Semiconductors by HREM at 400 kV --; Surface Structure of the Ceramic Superconductor YBa2Cu3O7 --; A New Octagonal Quasicrystal and Related Crystalline Phases in Rapidly Solidified Mn4Si --; Digital Image Processing for High Resolution Electron Microscopy --; Modulation par interfaces dans l'évolution quasi-continue de systèmes a deux sortes de couches --; Grain Boundary Orientation Determination in Transmission Electron Microscopy --; Birefringence and y-Ray Study of the Irreversible Behaviour of the Incommensurate Phase of Quartz --; Surface Phase Transformation in Monoclinic ZrO2 --; Coherency Strains and Growth of Artifically Modulated Cu-Ni Thin Films 579 --; Composition Faults in Zn m In2Sa 2+m Crystals --; High Resolution Electron Microscopic Study of the X-Phase in Cu-Al and Cu-Al-Zn Alloys --; Electron Microscope Image Contrast Formed by Electrons from Elastic- Inelastic and Inelastic-Elastic Scattering Processes --; Ordering of Ni3Mn and Diffusivity of Hydrogen in the Alloy --; Room Temperature Oxidation in Air of Polycrystalline CuZn --; Determination of the Optical Constants n, k of Zn3In2S6 and Zn5In2S8 from Transmission Measurements --; Static Magnetic Susceptibilities of Poly(phenylethynylcopper) Doped with Iodine --; The Origin of Microtwinning in Room Temperature Indented Undoped and n-Doped GaAs Crystals --; TiAl2: A Reentrant Phase in the Ti-Al System --; Analytical Electron Microscopy of Advanced Materials --; The Observation of In Situ and Ex Situ Oxidation Processes for ZnTe Surfaces by High-Resolution Electron Microscopy --; The Al-Co Decagonal Phase --; Phase Changes and Structural Features of Cu3Au II in a Gold-Copper-Silver Ternary Alloy during Isothermal Ageing --; The Surface Reaction of Pd/MgO Studied by Scanning Reflection Electron Microscopy --; Temperature Effects on the V2O5 Surface Phonon Spectrum --; Dark Field Equivalency Conditions for Tilted Incident Beam --; Structural and Analytical Electron Microscopy of Dislocation Loops and Precipitates Formed during Ageing of an a-Bombarded Mn-Cr Austenitic Steel --; Transmission Electron Microscopy Observation of Crystal Defects in a Natural Diopside Mineral --; Non-Isothermal Crystallization of Bi2S3 from Glassy (GeS2)0.5(Bi2S3)0.5 --; X-Ray Diffraction and Electron Microscopy Studies of a- and b-Ga2S3 --; Guinier-Preston Zones in the a -Phase of Superplastic Zn-Al Alloy --; Inelastic Scattering of Fast Electrons by Small Metal Particles --; Planar Defects in Low Temperature Quartz --; Experimental Study of Structure Modification of 2M 1 -Museovite by High- Resolution Electron Microscopy HREM --; The Crystal Structure of Stage-2 4H-Ag 0.22 NbS 2 --; HREM Investigations of Defects in Sintered YBa2Cu3O 7-5 --; Unified Approach to the High-Energy Approximation in Transmission Electron Microscopy --; Correlations between Thermal Donor Formation, Rod-Like Defect Formation, and Oxygen Reduction during Low-Temperature Annealing of CZ-Grown Silicon --; TEM Investigations of Ni-Cu Thin Film Coatings Obtained by Multilayer Technique, Coevaporation, and Ion Beam Assisted Deposition --; X-Ray and Electron Diffraction Study of Intercalates AgxTaS2 --; Short Notes --; Neutron Diffraction Determination of Mn and Zn Structure Positions in MnZnSb --; Investigation of Nanometer Layer Heterostructures by X-Ray Grazing Incidence Diffraction --; Radiation-Induced Volume Changes in Thermoluminescent-Active Materials --; Structure of Silicon after B + and P+ Implantation and Rapid Thermal Annealing --; Correlation of the Diffusion Coefficients of Various Elements Diffusing in Ferromagnetic and Paramagnetic a-Fe --; Electrical Conductivity of Thin Metallic Films --; A Regenerative Switching Device in a Silicon-Earthalkalifluoride Heterostructure Grown by Molecular Beam Epitaxy --; In-Se Thin Films: Crystallization and Optical Properties --; Kinetic Properties of the Fe 1-x a Zn x Cr 2 S 4 (0 < x < 1) System --; Resistivity and Magnetic Properties of Bi-Sr-Ca-Cu-O Superconductor --; Radiation Effect on the Superconductivity in the Y-Sm-Ba-Cu-O Ceramic System --; On Magnetic Properties of the Superconductor Y1Ba2Cu3O x --; Anomalous Strong Divergence of the Specific Heat of Erln3 at the Antiferromagnetic Transition --; Effect of Tensile Strain on Barkhausen Jumps in Amorphous Metal Ribbons of Fe80B 20 --; A Mossbauer Study of the Reaction between Barium Carbonate and Iron(III) Oxide --; Optical Properties of TlBiS2 Monocrystals --; On the Current Density Dependence of Electromigration in Thin Films --; Pre-Printed Titles --; Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) --; Substance Classification1 --; Backmatter; restricted access; Issued also in print
UR  - https://doi.org/10.1515/9783112493007
UR  - https://www.degruyter.com/isbn/9783112493007
UR  - https://www.degruyter.com/document/cover/isbn/9783112493007/original
ER  -