TY  - BOOK
AU  - Abdullaev,A.B.
AU  - Aboelfotoh,M.O.
AU  - Abrikosov,N.Kh
AU  - Al-Saffar,I.S.
AU  - Alyanov,M.A.
AU  - Amado,M.M.
AU  - Androussi,Y.
AU  - Arkan,O.B.
AU  - Avilov,E.S.
AU  - Backs,D.
AU  - Bak-Misiuk,J.
AU  - Bennaceur,R.
AU  - Bernhardt,Hj
AU  - Bezlrganyan,P.H.
AU  - Bolmaro,R.E.
AU  - Bonetti,E.
AU  - Braga,M.E.
AU  - Chiara,A.Di
AU  - Christakudis,G.Ch
AU  - Chryssou,E.
AU  - Dass,N.
AU  - Devi,Prameela
AU  - Dimmig,A.
AU  - Dimmig,Th
AU  - Erzgräber,H.-J.
AU  - Fathallah,M.
AU  - Fidler,J.
AU  - Filipavicius,V.
AU  - Fukuda,Y.
AU  - Gaidys,R.
AU  - Ghibaudo,G.
AU  - Godowski,P.
AU  - Gondi,P.
AU  - Gronkowski,J.
AU  - Gumbatov,D.O.
AU  - Görlich
AU  - Haefner,H.
AU  - Haroutyunyan,V.S.
AU  - Hartwig,J.
AU  - Haworth,L.I.
AU  - Hergt,R.
AU  - Hogarth,C.A.
AU  - Hrider,M.
AU  - Huang,Y.
AU  - Igasaki,Y.
AU  - Islam,M.H.
AU  - Ivanchin,A.G.
AU  - Jacobs,B.
AU  - Januschewski,F.
AU  - Jeffrey,F.R.
AU  - Kido,H.
AU  - Kittler,M.
AU  - Koch,F.
AU  - Kreissl,J.
AU  - Kumari,M.
AU  - Kurbanov,G.Z.
AU  - Lefebvre,A.
AU  - Lindstrom,J.L.
AU  - Liu,D.
AU  - Mamedov,K.K.
AU  - Massot,M.
AU  - Matulaitis,V.-A.
AU  - Mayer,J.
AU  - Mekhtiev,M.I.
AU  - Michel,B.
AU  - Mitdank,R.
AU  - Mitsuhashi,H.
AU  - Miura,K.
AU  - Miyazaki,T.
AU  - Montenegro,J.D.
AU  - Moreira,J.M.
AU  - Naimi,E.K.
AU  - Nazarov,A.M.
AU  - Neite,G.
AU  - Nembach,E.
AU  - Neuhäuser,H.
AU  - Northwood,D.O.
AU  - Ochiai,Y.
AU  - Oehrlein,G.S.
AU  - Oelgart,G.
AU  - Palewski,T.
AU  - Patrin,G.S.
AU  - Peluso,G.
AU  - Perov,G.V.
AU  - Petrakovskii,G.A.
AU  - Petrauskas,G.
AU  - Pfeiffer,H.
AU  - Pincik,E.
AU  - Plachkova,S.K.
AU  - Povolo,F.
AU  - Procop,M.
AU  - Pulatov,U.U.
AU  - Radzhabov,T.D.
AU  - Raidt,H.
AU  - Rheinländer,B.
AU  - Richter,H.
AU  - Rudenko,V.V.
AU  - Rudny,J.
AU  - Said,M.Ben
AU  - Sakalas,A.
AU  - Sakalauskas,S.
AU  - Salem,M.Ben
AU  - Salman,E.G.
AU  - Sandow,B.
AU  - Sathaiah,G.
AU  - Schmalz,K.
AU  - Schröer,W.
AU  - Scottidi Uccio,U.
AU  - Seifert,W.
AU  - Sekulski,J.
AU  - Shalumov,B.Z.
AU  - Shelimova,L.E.
AU  - Sili,A.
AU  - Sirdeshmukh,Lalitha
AU  - Smith,I.O.
AU  - Sousa,J.B.
AU  - Stefano,S.De
AU  - Tabata,K.
AU  - Takada,H.
AU  - Takahashi,M.
AU  - Takeuchi,N.
AU  - Tawancy,H.M.
AU  - Teng,M.K.
AU  - Thielemann,W.
AU  - Thurzo,I.
AU  - Tittelbach-Helmrich,K.
AU  - Tomita,A.
AU  - Tomlinson,R.D.
AU  - Tovar,R.B.
AU  - Tran,N.T.
AU  - Tyapunina,N.A.
AU  - Urban,K.
AU  - Vanderschaeve,G.
AU  - Vertoprakiiov,V.N.
AU  - Vittori,J.F.
AU  - Wallow,F.
AU  - Wang,R.
AU  - Wasim,S.M.
AU  - Weiss,H.-J.
AU  - Weman,H.
AU  - Wierzchowski,W.
AU  - Will,P.
AU  - Wojciechowski,W.
AU  - Ziolkiewicz,S.
AU  - Zor,M.
AU  - Zych,W.
TI  - Physica status solidi / A. 
T2  - Physica status solidi / A.
SN  - 9783112501658
PY  - 2022///]
CY  - Berlin, Boston : 
PB  - De Gruyter, 
KW  - SCIENCE / General
KW  - bisacsh
N1  - Frontmatter --; International Classification System for Physics --; Contents --; Original Papers and Short Notes --; Structure; crystallography --; On the Interference Effect Arising in the Bicrystal X-Ray Interferometer with Wedge-Shaped Gap. II. Spherical Wave Theory --; Ultra-Thin Foil Thickness Determination from Large-Angle Convergent Beam Electron Diffraction Patterns --; X-Ray Spherical-Wave Diffraction in the Bragg Case for Bent Si Crystals --; Defects; nonelectronic transport --; Dislocation Internal Friction in Csl Single Crystals --; Work-Hardening and Recovery during the Steady-State Creep of Polycrystalline Cadmium --; Relaxation Phenomena of Dislocations Contributing to Deformation of A1 at Intermediate Temperatures --; Dislocation Velocities in Cu-Ni Alloys Determined by the Stress Pulse-Etch Pit Technique and by Slip Line Cinematography --; The Investigation of Point Defects in Lead Molybdate Crystals Which Lead to the Change of Absorption and Fluorescence Properties --; A TEM Investigation of the Dislocation Rosettes around Vickers Indentations in GaAs --; Lattice properties --; Low-Temperature Heat Capacity and Thermodynamic Properties of Silicon-Dioxide-Based Binary Vitreous Systems --; Average Elastic Constants and Tensor Invariants --; An Application of Potential Theory for Solving the Plane Elastic Crack Problem --; Conditions générales d'obtention de parois cohérentes sans contraintes entre domaines élastiques --; Experimental Observations of Transient Phases during Long-Range Ordering to Ni4Mo in a Ni- Mo- Fe- Cr Alloy --; Phase Transitions between the Quasicrystalline, Crystalline, and Amorphous Phases in Al-16 at% V --; Nonlinear Resonances in Mn-7 at% Cu --; Stiffness Constants, Dislocation Line Energies, and Tensions of M8A1 and of the y -Phases of NIMONIC 105 and of NIMONIC PE16 --; On Deriving Tickers Hardness from Penetration Depth --; Surfaces, interfaces, thin films; lower-dimensional systems --; Some Optical and Structural Studies on SiO/SnO2 Thin Films --; High-Field Electrical Conduction in Thin Films of Polyethylene --; Determination of the Low Absorption Coefficients of Thin Cd1-xZnxS Films by Photothermal Deflection Spectroscopy --; Effect of Sulphur on the Surface Segregation in Co50Ni50 Alloy --; Ionic Current Study in Thermally Grown Silicon Dioxide Films on Polycrystalline Silicon --; Investigation of the Surface States in Heavily Doped GaAs by Kelvin Probe --; Influence of Texture Formation on Properties of Films for Perpendicular Magnetic Recording --; Characterization of the Leakage-Current Diffusion Component in Intrinsically Gettered Silicon by EBIC --; Auger Electron and X-Ray Spectroscopic Analysis of Au-Ge Contacts to GaAs --; Localized electronic states --; Thermal Donors and Carbon-Oxygen Defects in Silicon --; Electronic transport; superconductivity --; Electrical Resistivity and Scattering Mechanisms of (GeTe)1-x ((Ag2Te)1-y (Sb2Te3)y)x Solid Solutions (y = 0.6) --; Electrical Characteristics of Melt Grown CuInTe2 Single Crystals --; Magnetic properties; resonances --; Magnetic Properties of Rapidly Quenched Fe75B25-xNdx (0 ≤ x ≤ 25) Alloys --; Photoinduced Change of Magnetic Resonance in FeBO3 Single Crystals --; Study of the Magnetic Transitions in CeFe2 with High Resolution Transport Property Measurements --; Dielectric and optical properties --; Dielectric Properties of the KCl-KBr Mixed Crystal System --; Dielectric and Ferroelectric Properties in AsxSb1-xSI Mixed Crystals --; Device-related phenomena --; Modelling the Influence of Hot Electrons on the Transfer Characteristic of Short-Channel MOSFETs --; Properties of Red Light-Emitting (AlGa)As Single-Heterostructure Diodes. I. Structure Characterization --; Short Notes --; On the Thermal Conductivity of CuInSe2xS2(1-x) --; Pressure Dependence of the Bulk Modulus in Solids --; Transformation Toughening Fatigue Crack Growth --; Surface Properties of Ion Alloyed Thin Dysprosium Films --; Dose Dependence of N(E-F) in Evaporated a-Si --; Attempts to Find a Correlation between the GaAs Plasma Oxide Growth Conditions and the Charge DLTS Response of Interface States --; On DLTS-Measurements of t h e Barrier-Limited Capture Process --; Thermally Stimulated Exoelectron Emission (TSEE) of Heat Treated K2SO4 and of Sm-Dy-Doped K2SO4 --; Aspects of Magnetic Penetration in Vanadium Based Josephson Junctions --; Polynomial Expression of the Bloch-Gruneisen Integral — Application to an Analysis of the Resistivity-Temperature Variation of Metals --; EPR Investigations on Mn-Doped CVD-Grown ZnS Thin Film Layers --; Preparation and Magnetic Properties-of La1-xThxCoO3 Compounds --; The Dependence of the Hyperfine Magnetic Field in Amorphous Alloys of the Type Fe80-xTMxB20 on TM, x, and Temperature --; The Influence of Yttrium Substitution on the Ferromagnetic Transition of Uranium Selenide --; Thermoluminescence and Thermally Stimulated Exoelectron Emission of Sintered CaB4O7 Doped with Fb, Eu, or Dy --; On the Possibility of Application of the Derivative Lightoutput-Voltage Characteristic for the Analysis of Electron-Phonon Interaction in Electroluminescent ZnSe MPS Structures --; Effects of Carbon Profiles at the p/i Interface in Amorphous Silicon Solar Cells --; A Simple Model of the Drain Saturation Voltage Dependence with Gate Voltage for Short-Channel MOSFETs --; Pre-Printed Titles --; Pre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) --; Substance Classification --; Backmatter; restricted access; Issued also in print
UR  - https://doi.org/10.1515/9783112501665
UR  - https://www.degruyter.com/isbn/9783112501665
UR  - https://www.degruyter.com/document/cover/isbn/9783112501665/original
ER  -