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_a10.1515/9783112493007 _2doi |
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| 035 | _a(DE-B1597)9783112493007 | ||
| 035 | _a(DE-B1597)599723 | ||
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| 084 | _aonline - DeGruyter | ||
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_aPhysica status solidi / A. _nVolume 107, Number 2, _pJune 16 / _ced. by Görlich. |
| 250 | _aReprint 2021 | ||
| 264 | 1 |
_aBerlin ; _aBoston : _bDe Gruyter, _c[2022] |
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| 264 | 4 | _c©1988 | |
| 300 | _a1 online resource (556 p.) | ||
| 336 |
_atext _btxt _2rdacontent |
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_acomputer _bc _2rdamedia |
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_aonline resource _bcr _2rdacarrier |
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_aPhysica status solidi / A. ; _vVolume 107, Number 2 |
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_tFrontmatter -- _tInternational Classification System for Physics -- _tLaudatio -- _tContents -- _tOriginal Papers -- _tBod-Like Defects in Silicon: Coesite or Hexagonal Silicon -- _tThickness of Interfaces between Twins, Glide Domains, and Grain Boundaries in Oxides from HREM Studies (Sm2O3, Nd2O3, Pr7O12, Tb12O22, and YBa2Cu3O7-x) -- _tDirect Observation of Atomic Columns in Semiconductors by HREM at 400 kV -- _tSurface Structure of the Ceramic Superconductor YBa2Cu3O7 -- _tA New Octagonal Quasicrystal and Related Crystalline Phases in Rapidly Solidified Mn4Si -- _tDigital Image Processing for High Resolution Electron Microscopy -- _tModulation par interfaces dans l'évolution quasi-continue de systèmes a deux sortes de couches -- _tGrain Boundary Orientation Determination in Transmission Electron Microscopy -- _tBirefringence and y-Ray Study of the Irreversible Behaviour of the Incommensurate Phase of Quartz -- _tSurface Phase Transformation in Monoclinic ZrO2 -- _tCoherency Strains and Growth of Artifically Modulated Cu-Ni Thin Films 579 -- _tComposition Faults in Zn m In2Sa 2+m Crystals -- _tHigh Resolution Electron Microscopic Study of the X-Phase in Cu-Al and Cu-Al-Zn Alloys -- _tElectron Microscope Image Contrast Formed by Electrons from Elastic- Inelastic and Inelastic-Elastic Scattering Processes -- _tOrdering of Ni3Mn and Diffusivity of Hydrogen in the Alloy -- _tRoom Temperature Oxidation in Air of Polycrystalline CuZn -- _tDetermination of the Optical Constants n, k of Zn3In2S6 and Zn5In2S8 from Transmission Measurements -- _tStatic Magnetic Susceptibilities of Poly(phenylethynylcopper) Doped with Iodine -- _tThe Origin of Microtwinning in Room Temperature Indented Undoped and n-Doped GaAs Crystals -- _tTiAl2: A Reentrant Phase in the Ti-Al System -- _tAnalytical Electron Microscopy of Advanced Materials -- _tThe Observation of In Situ and Ex Situ Oxidation Processes for ZnTe Surfaces by High-Resolution Electron Microscopy -- _tThe Al-Co Decagonal Phase -- _tPhase Changes and Structural Features of Cu3Au II in a Gold-Copper-Silver Ternary Alloy during Isothermal Ageing -- _tThe Surface Reaction of Pd/MgO Studied by Scanning Reflection Electron Microscopy -- _tTemperature Effects on the V2O5 Surface Phonon Spectrum -- _tDark Field Equivalency Conditions for Tilted Incident Beam -- _tStructural and Analytical Electron Microscopy of Dislocation Loops and Precipitates Formed during Ageing of an a-Bombarded Mn-Cr Austenitic Steel -- _tTransmission Electron Microscopy Observation of Crystal Defects in a Natural Diopside Mineral -- _tNon-Isothermal Crystallization of Bi2S3 from Glassy (GeS2)0.5(Bi2S3)0.5 -- _tX-Ray Diffraction and Electron Microscopy Studies of a- and b-Ga2S3 -- _tGuinier-Preston Zones in the a -Phase of Superplastic Zn-Al Alloy -- _tInelastic Scattering of Fast Electrons by Small Metal Particles -- _tPlanar Defects in Low Temperature Quartz -- _tExperimental Study of Structure Modification of 2M 1 -Museovite by High- Resolution Electron Microscopy HREM -- _tThe Crystal Structure of Stage-2 4H-Ag 0.22 NbS 2 -- _tHREM Investigations of Defects in Sintered YBa2Cu3O 7-5 -- _tUnified Approach to the High-Energy Approximation in Transmission Electron Microscopy -- _tCorrelations between Thermal Donor Formation, Rod-Like Defect Formation, and Oxygen Reduction during Low-Temperature Annealing of CZ-Grown Silicon -- _tTEM Investigations of Ni-Cu Thin Film Coatings Obtained by Multilayer Technique, Coevaporation, and Ion Beam Assisted Deposition -- _tX-Ray and Electron Diffraction Study of Intercalates AgxTaS2 -- _tShort Notes -- _tNeutron Diffraction Determination of Mn and Zn Structure Positions in MnZnSb -- _tInvestigation of Nanometer Layer Heterostructures by X-Ray Grazing Incidence Diffraction -- _tRadiation-Induced Volume Changes in Thermoluminescent-Active Materials -- _tStructure of Silicon after B + and P+ Implantation and Rapid Thermal Annealing -- _tCorrelation of the Diffusion Coefficients of Various Elements Diffusing in Ferromagnetic and Paramagnetic a-Fe -- _tElectrical Conductivity of Thin Metallic Films -- _tA Regenerative Switching Device in a Silicon-Earthalkalifluoride Heterostructure Grown by Molecular Beam Epitaxy -- _tIn-Se Thin Films: Crystallization and Optical Properties -- _tKinetic Properties of the Fe 1-x a Zn x Cr 2 S 4 (0 < x < 1) System -- _tResistivity and Magnetic Properties of Bi-Sr-Ca-Cu-O Superconductor -- _tRadiation Effect on the Superconductivity in the Y-Sm-Ba-Cu-O Ceramic System -- _tOn Magnetic Properties of the Superconductor Y1Ba2Cu3O x -- _tAnomalous Strong Divergence of the Specific Heat of Erln3 at the Antiferromagnetic Transition -- _tEffect of Tensile Strain on Barkhausen Jumps in Amorphous Metal Ribbons of Fe80B 20 -- _tA Mossbauer Study of the Reaction between Barium Carbonate and Iron(III) Oxide -- _tOptical Properties of TlBiS2 Monocrystals -- _tOn the Current Density Dependence of Electromigration in Thin Films -- _tPre-Printed Titles -- _tPre-Printed Titles of papers to be published in the next issues of physica status solidi (a) and physica status solidi (b) -- _tSubstance Classification1 -- _tBackmatter |
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_arestricted access _uhttp://purl.org/coar/access_right/c_16ec _fonline access with authorization _2star |
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| 530 | _aIssued also in print. | ||
| 538 | _aMode of access: Internet via World Wide Web. | ||
| 546 | _aIn English. | ||
| 588 | 0 | _aDescription based on online resource; title from PDF title page (publisher's Web site, viewed 01. Dez 2022) | |
| 650 | 7 |
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| 856 | 4 | 0 | _uhttps://doi.org/10.1515/9783112493007 |
| 856 | 4 | 0 | _uhttps://www.degruyter.com/isbn/9783112493007 |
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